تحلیل محاسباتی نقش پروتون‌های کم‌انرژی در وقوع به‌هم‌ریختگی‌های تک‌حادثه‌ای بر یک حافظه SRAM با فن‌آوری 65 نانومتری CMOS

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ژورنال

عنوان ژورنال: مجله علوم و فنون هسته ای

سال: 2020

ISSN: 2676-5861

DOI: 10.24200/nst.2020.1141